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Recherche - Valorisation

3D X-ray imaging of damage and deformation processes in polycrystalline materials

le 7 février 2013
13H30

Wolfgang LUDWIG, Directeur de Recherche au CNRS, Laboratoire MATEIS, détaché à l'ESRF

3D X ray imaging

3D X ray imaging

In the course of the last decade, a number of synchrotron X-ray polycrystal grain mapping techniques have emerged.

We will review the current state of the art in this rapidly evolving field of non-destructive characterization, which offers interesting possibilities to investigate deformation and damage mechanisms in structural materials.
Copying the concepts of  electron microscopy,  current trends in X-ray characterization are towards combination of different imaging and diffraction modes on the same instrument. This leads to a hierarchical characterization scheme, covering length scales from 1mm down to 100 nm.
In particular, the use of X-ray optics enables us to "zoom" on individual grains and to form magnified images  ("X-ray darkfield microscopy")  of grains, deeply embedded in the bulk of a polycrystalline samples. With an angular resolution at least two orders of magnitude better than
transmission electron microscopy, this combined  imaging and diffraction modality provides highly complementary information about the deformation sub-structure encountered in metals. The possibilities and limitations of this approach will be illustrated with some first examples of application.

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In the course of the last decade, a number of synchrotron X-ray polycrystal grain mapping techniques have emerged.
We will review the current state of the art in this rapidly evolving field of non-destructive characterization, which offers interesting possibilities to investigate deformation and damage mechanisms in structural materials.
Copying the concepts of  electron microscopy,  current trends in X-ray characterization are towards combination of different imaging and diffraction modes on the same instrument. This leads to a hierarchical characterization scheme, covering length scales from 1mm down to 100 nm.
In particular, the use of X-ray optics enables us to "zoom" on individual grains and to form magnified images  ("X-ray darkfield microscopy")  of grains, deeply embedded in the bulk of a polycrystalline samples. With an angular resolution at least two orders of magnitude better than transmission electron microscopy, this combined  imaging and diffraction modality provides highly complementary information about then deformation sub-structure encountered in metals. The possibilities and limitations of this approach will be illustrated with some first examples of application.
Type :
Séminaires - conférences
Lieu(x) :
Campus de Cachan

Agenda des séminaires 2013

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